Àá½Ã¸¸ ±â´Ù·Á ÁÖ¼¼¿ä. ·ÎµùÁßÀÔ´Ï´Ù.
KMID : 1059519840280030149
Journal of the Korean Chemical Society
1984 Volume.28 No. 3 p.149 ~ p.154
Defect Structure and Electrical Conduction Mechanism of Yttrium Sesquioxide
Kim Keu-Hong

Park Soung-Ho
Choi Jae-Shi
Abstract
The electrical conductivity of p-type yttrium sesquioxide has been measured as a function of temperature and of oxygen partial pressure at temperatures from 650 to 1050¡É and oxygen partial pressures from 1 ¡¿ 10-5 to 2 ¡¿ 10-1atm. Plots of log conductivity vs. 1/T at constant oxygen partial pressures are found to be linear with low-and high-temperature dependences of conductivity. The high-temperature dependence of conductivity shows two different defect structures. The plots of log conductivity vs. log PO2 are found to be linear at PO2's of 10-5 to 10-1 atm. The electrical conductivity dependences on PO2 are found to be ¥ò¡ðPO21/6 at 850~950¡É, ¥ò¡ðPO23/16 at 950~1050¡É and ¥ò¡ðPO21/7.5 ~ ¥ò¡ðPO21/8.3 at 650~800¡É, respectively. The defect structures are Oi" at 850~950¡É and VM''' at 950~1050¡É. The electron hole is main carrier type, however, ionic contribution is found at lower temperature portion.
KEYWORD
FullTexts / Linksout information
Listed journal information
ÇмúÁøÈïÀç´Ü(KCI)